Paper:
Assessment of Radiation Tolerance of Flash Memory by γ-Ray Irradiation
Kenichiro Takakura*1 , Kensuke Matsumoto*2, Kousei Tateishi*2, Masashi Yoneoka*3, Isao Tsunoda*1 , Shigekazu Suzuki*4, and Shinji Kawatsuma*4
*1Faculty of Electronics and Information Systems Engineering, Kumamoto KOSEN
2659-2 Suya, Koshi city, Kumamoto 861-1102, Japan
*2Electronics and Information Systems Engineering Advanced Course, Kumamoto KOSEN
2659-2 Suya, Koshi city, Kumamoto 861-1102, Japan
*3Center for Technical and Educational Support, Kumamoto KOSEN
2659-2 Suya, Koshi city, Kumamoto 861-1102, Japan
*4Department of Mechanical System Engineering, Fukushima KOSEN
30 Nagao, Kamiarakawa, Taira, Iwaki, Fukushima 970-8034, Japan
The radiation tolerance of a microcontroller (Raspberry Pi) required for the development of decommissioning robots was investigated. We found that the flash memory needed to boot the microcontroller had particularly low-radiation tolerance, significantly reducing the operation duration of the microcontroller in a radiation environment. We also found that certain high-performance flash memories have high radiation tolerance. Investigation of the process by which flash memory becomes inoperable revealed that internal memory information is rewritten owing to irradiation, leading to limited lifetime for memory.
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