Development of Dimensional X-Ray Computed Tomography

Hiroyuki Fujimoto; Makoto Abe; Sonko Osawa; Osamu Sato; Toshiyuki Takatsuji

doi:10.20965/ijat.2015.p0567

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IJAT Vol.9 No.5 pp. 567-571

doi: 10.20965/ijat.2015.p0567

(2015)

Paper:

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Development of Dimensional X-Ray Computed Tomography

Hiroyuki Fujimoto, Makoto Abe, Sonko Osawa, Osamu Sato, and Toshiyuki Takatsuji

National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)
1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan

Received:

February 14, 2015

Accepted:

June 5, 2015

Published:

September 5, 2015

Keywords:

x-ray computed tomography, dimensional measurement, reference gauge, industrial standards

Abstract

Recently, a strong need has arisen for a dimensional X-ray computed tomography system that is capable of dimensional measurements. This is because the speedy realization of dimensional measurements for outward forms and inward forms on dense spatial points remarkably simplifies and accelerates production loop. However, although the image obtained via XCT describes the structure clearly and in great detail, dimensional metrology by means of XCT is not simple. The National Metrology Institute of Japan has been carrying out performance tests using gauges that include the gauges proposed in ISO10360. In this work, the magnification variation correction is carefully presented, and a maximum deviation of less than 5 μm is shown to be possible by means of the measurement of the forest phantom of 27 ruby spheres, the locations of which are calibrated by the coordinate measuring machine.

Cite this article as:

Hiroyuki Fujimoto, Makoto Abe, Sonko Osawa, Osamu Sato, and Toshiyuki Takatsuji, “Development of Dimensional X-Ray Computed Tomography,” Int. J. Automation Technol., Vol.9, No.5, pp. 567-571, 2015.

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References

[1] J. P. Kruth, M. Bartscher, S. Carmignato, R. Schmitt, L. De Chiffre, and A. Weckenmann, “Computed tomography for dimensional metrology,” CIRP Annals, Vol.60, pp. 821-842, 2011.
[2] Y. Tan, K. Kiekens, F. Welkenhuyzen, J. P. Kruth, and W. Dewulf, “Beam hardening correction and its influence on the measurement accuracy and repeatability for CT dimensional metrology applications,” Proc. of iCT2012, pp. 355-362, 2012.
[3] M. Baer, M. Hammer, M. Knaup, I. Schmidt, R. Christoph, and M. Kachelriess, “Scatter Correction Methods in Dimensional CT,” Proc. of iCT2012, pp. 271-278, 2012.

This article is published under a Creative Commons Attribution-NoDerivatives 4.0 Internationa License.

[1] [1] J. P. Kruth, M. Bartscher, S. Carmignato, R. Schmitt, L. De Chiffre, and A. Weckenmann, “Computed tomography for dimensional metrology,” CIRP Annals, Vol.60, pp. 821-842, 2011.

[2] [2] Y. Tan, K. Kiekens, F. Welkenhuyzen, J. P. Kruth, and W. Dewulf, “Beam hardening correction and its influence on the measurement accuracy and repeatability for CT dimensional metrology applications,” Proc. of iCT2012, pp. 355-362, 2012.

[3] [3] M. Baer, M. Hammer, M. Knaup, I. Schmidt, R. Christoph, and M. Kachelriess, “Scatter Correction Methods in Dimensional CT,” Proc. of iCT2012, pp. 271-278, 2012.