IJAT Vol.9 No.5 pp. 530-533
doi: 10.20965/ijat.2015.p0530


CMM Dynamic Properties of the Scanning Measurement of a 2D Profile

Adam Woźniak and Grzegorz Krajewski

Institute of Metrology and Biomedical Engineering, Warsaw University of Technology
’Sw. A. Boboli 8 St. 02-525 Warsaw, Poland

November 13, 2014
May 19, 2015
September 5, 2015
measurement, coordinate metrology, scanning probes

Scanning probe CMMs have come to be considered the standard in coordinate metrology, not only because they provide high-quantity, high-speed data gathering but also because the scanning technology significantly decreases inspection time. Modern manufacturing, especially in today’s highly competitive economy, requires increasingly efficient measuring machines and processes because inspection machines have often become the bottlenecks in the entire manufacturing processes. More efficient coordinate metrology can mean faster measurement cycles with acceptable accuracies. However, increasing scanning speeds has also significantly increased errors. This article proposes a new method of investigating and identifying the principal components of CMM dynamic errors. The principle of the method is presented, and the validity of the method is experimentally confirmed on a bridge coordinate measuring machine.

Cite this article as:
A. Woźniak and G. Krajewski, “CMM Dynamic Properties of the Scanning Measurement of a 2D Profile,” Int. J. Automation Technol., Vol.9, No.5, pp. 530-533, 2015.
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Last updated on Aug. 21, 2019