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IJAT Vol.5 No.2 pp. 236-240
doi: 10.20965/ijat.2011.p0236
(2011)

Paper:

Thin Film Thickness Measurement by Surface Plasmon Resonance Using a Modified Otto’s Configuration Combined with Ellipsometry

Yasuhiro Mizutani and Tetsuo Iwata

Institute of Science and Technology, The University of Tokushima, Minamijo-sajima-cho 2-1, Tokushima 770-8506, Japan

Received:
December 14, 2010
Accepted:
December 22, 2010
Published:
March 5, 2011
Keywords:
thin film measurement, surface prasmon resonance, Otto’s configuration, ellipsometry
Abstract

We have developed a method of measuring thin film thickness by using two optical properties that are highsensitivity for a film thickness, such as surface plasmon resonance (SPR) and elliptical properties with SPR response. The SPR signal is high sensitivity, suitable for measuring the thickness of a sample with a thin layer. This phenomenon can be detected by measuring the absorbance on the sample surface. We focused on the Otto configuration, a famous method for the generation of a SPR signal, which consists of 4 layers such as a SiO2 substrate, air, dielectric material and a metal layer. It is useful for the measurement of thin film thickness because there is an air layer in the configuration. However, the configuration has the disadvantage: it is necessary to adjust the distance from sample surface to the SiO2 substrate on a nanometer order. To overcome the problem, we focused on the modified Otto’s configuration proposed by Bliokh et. al [Appl. Phys. Lett. 89, 021908 (2006)]. In the configuration, there is a plano-convex lens of SiO2 as the substrate. By using its curvature, there is no adjustment process and the SPR signal can be detected easily. The SPR signal has a polarization property that depends on the thin film thickness. By analyzing of polarization properties of the SPR signal by means of ellipsometry, thin film thickness can be measured with sub-nanometer accuracy which is higher than the SPR signals. In this paper, further results involving the measurement are presented and discussed.

Cite this article as:
Y. Mizutani and T. Iwata, “Thin Film Thickness Measurement by Surface Plasmon Resonance Using a Modified Otto’s Configuration Combined with Ellipsometry,” Int. J. Automation Technol., Vol.5, No.2, pp. 236-240, 2011.
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References
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Last updated on Nov. 18, 2019