On-Machine Measurement of Tool Cutting Edge Profiles
Takemi Asai, Sayeda Ferdous, Yoshikazu Arai, Yi Yang, and Wei Gao
Nano-Metrology and Control Laboratory, Department of Nanomechanics, Tohoku University, 6-6-01 Aramaki Aoba, Aoba-ku, Sendai, Miyagi 980-8579, Japan
An on-machine profile measuring system for diamond cutting tools was constructed. It is based on the atomic force microscope (AFM). The characteristics evaluation experiment of the AFM unit was carried out. On-machine measurements of three tools, one having a straight cutting edge and the other two having round edges with nose radii of 0.2 mm and 0.1 mm, respectively, were conducted to demonstrate the applicability of this system.
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