JACIII Vol.17 No.4 pp. 526-534
doi: 10.20965/jaciii.2013.p0526


Dynamic Scheduling Approaches to Wafer Test Scheduling with Unpredictable Error

Tsubasa Matsuo*, Masahiro Inuiguchi*, and Kenichiro Masunaga**

*Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama-cho, Toyonaka, Osaka 560-8531, Japan

**Renesas Electronics Co., 2-6-2 Otemachi, Chiyoda-ku, Tokyo 100-0004, Janapn

February 28, 2013
April 12, 2013
July 20, 2013
semiconductor manufacturing, simulation, genetic-based machine learning
Scheduling of semiconductor wafer testing processes can be seen as a resource constraint project scheduling problem (RCPSP). However, it includes uncertainties caused by human factors, wafer errors and so on. Because some uncertainties are not simply quantitative, range estimation of the parameters would not be very useful. Considering such uncertainties, finding a good situation-dependent dispatching rule would be more suitable than solving the RCPSP under uncertainties. In this paper we apply the Pitts approach, one of the genetic algorithms, to the situation-dependent dispatching rule acquisition. We compare the obtained rule with the simple dispatching rules and examine the effectiveness and usefulness of the obtained rule in the problems with unpredictable wafer errors.
Cite this article as:
T. Matsuo, M. Inuiguchi, and K. Masunaga, “Dynamic Scheduling Approaches to Wafer Test Scheduling with Unpredictable Error,” J. Adv. Comput. Intell. Intell. Inform., Vol.17 No.4, pp. 526-534, 2013.
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Last updated on Jul. 19, 2024