This study designs and develops a new material measure with a chirp form. Material measures are measurement standards for calibration, verification, and inspection. Since material measures are essential for ensuring the traceability of surface texture instruments, we have been developing a manufacturing system to provide them. ISO 5436-1:2000 contains material measures with sinusoidal wave forms, random wave forms, triangular wave forms, trapezoidal wave forms, cusp forms, rectangular forms, etc. However, ISO 5436-1:2000 does not contain a material measure with a chirp (sweep) form. Therefore, we propose a material measure with a chirp form. Chirp signals are frequently used for various analyses in the fields of mechanical engineering, electrical engineering, physics, and others. The primary purpose of the proposed material measure with a chirp form is to rapidly and simply examine the characteristics and capabilities of implemented Gaussian filters. We designed the surface form of the material measure as a logarithmic chirp form to maximize the utility of the primary purpose in this study. The wavelength of the manufactured chirp form varies logarithmically in the lateral (x) direction. This paper presents the following five points: 1) the design and development of the material measure with a chirp form, 2) the application of the proposed material measure to the examination of the attenuation characteristics of implemented Gaussian filters, 3) the application of the proposed material measure to obtain the deformation of the roughness form due to the implemented Gaussian filters, 4) the application of the proposed material measure to specify the algorithm of the implemented Gaussian filters, and 5) the possibility of another application of the material measure with a chirp form.

1. [1] ISO 12179:2000, “Geometrical Product Specifications (GPS) – Surface texture: Profile method – Calibration of contact (stylus) instruments,” 2000 (JIS B 0670:2002).
2. [2] ISO 25178-6:2010, “Geometrical product specifications (GPS) – Surface texture: Areal – Part 6: Classification of methods for measuring surface texture,” 2010 (JIS B 0681-6).
3. [3] ISO 5436-1:2000, “Geometrical Product Specifications (GPS) – Surface texture: Profile method – Measurement standards – Part 1: Material measures,” 2000 (JIS B 0659-1:2002).
4. [4] ISO 5436-2:2012, “Geometrical Product Specifications (GPS) – Surface texture: Profile method – Measurement standards – Part 2: Software measurement standard,” 2012.
5. [5] ISO 25178-701:2010, “Geometrical product specifications (GPS) – Surface texture: Areal – Part 701: Calibration and measurement standards for contact (stylus) instruments,” 2010.
6. [6] ISO 4288:1996, “Geometrical product specifications (GPS) – surface texture: profile method – rules and procedure for the assessment of surface texture,” 1996 (JIS B 0633:2001).
7. [7] ISO 4287:1997, “Geometrical product specifications (GPS) – surface texture: profile method – terms, definitions and surface texture parameters,” 1997 (JIS B 0601:2013).
8. [8] Y. Okazaki, K. Naoi, N. Tanaka, and Y. Kobayashi, “Manufacturing and evaluation of surface roughness specimens – Sinusoidal surfaces based on ISO 5436 –,” Jpn. Soc. Prec. Eng. Autumn Meeting 2006, pp. 175-176, C15, 2006 (in Japanese).
9. [9] I. Yoshida, N. Tanaka, Y. Kobayashi. K. Miyamoto, Y. Okazaki, and N. Kato, “Manufacturing and evaluation of surface roughness specimens – Proposal and trial Manufacturing of specimens with new surface roughness form –,” Jpn. Soc. Prec. Eng. Spring Meeting 2010, pp. 417-418, E66, 2010 (in Japanese).
10. [10] I. Yoshida, H. Honda, K. Miyamoto, and Y. Okazaki, “Multiple Surface roughness measurement standard,” Japanese patent JP-5399934-B2, 2014.
11. [11] I. Yoshida, S. Miyamoto, K. Nemoto, K. Yanagi, and M. Aketagawa, “Manufacturing of roughness standards with irregular surface topography and their replication for areal surface texture measuring instruments,” Jpn. Soc. Prec. Eng. Autumn Meeting 2008, pp. 249-250, D16, 2008 (in Japanese).
12. [12] K. Yanagi, D. Kanda, K. Nemoto, T. Sakurai, I. Yoshida, and M. Aketagawa, “Development of measurement standard with random surface topography for areal surface texture measuring instruments,” Proc. 7th Int. EUSPEN Conf. 2007, Vol.1, pp. 389-392, 2007.
13. [13] K. Nemoto, K. Yanagi, M. Aketagawa, I. Yoshida, M. Uchidate, T. Miyaguchi, and H. Maruyama, “Development of a roughness measurement standard with irregular surface topography for improving 3D surface texture measurement,” Measurement Science and Technology, Vol.20, pp. 1-7, 2009. DOI: 10.1088/0957-0233/20/8/084023
14. [14] K. Nemoto, K. Yanagi, M. Aketagawa, D. Kanda, I. Yoshida, and M. Uchidate, “A study on surface material measures for areal surface texture measuring instruments - measuring conditions for the areal profiling,” Key Eng. Mater., Vol.381-382, pp. 241-244, 2008. DOI: 10.4028/www.scientific.net/KEM.381-382.241
15. [15] M. Uchidate, K. Yanagi, I. Yoshida, T. Shimizu, and A. Iwabuchi, “Generation of 3-D random topography datasets with periodic boundaries for surface metrology algorithms and measurement standards,” Wear, Vol.271, pp. 565-570, 2011. DOI: 10.1016/j.wear.2010.04.035
16. [16] M. Uchidate, T. Shimizu, and A. Iwabuchi, “Generation of three dimensional surface topography using non-causal two dimensional AR model,” Proc. Int. Tribology Conf. Nagasaki, pp. 223-228, 2001.
17. [17] M. Uchidate, T. Shimizu, A. Iwabuchi, and K. Yanagi, “Generation of reference data of 3D surface texture using the non-causal 2D AR model,” Wear, Vol.257, pp. 1288-1295, 2004. DOI: 10.1016/j.wear.2004.05.019
18. [18] HALLE-Pr_azisions-Kalibriernormale GmbH homepage: http://www.halle-normale.de/framesets/englisch/startside/startside.html [accessed July 29, 2017].
19. [19] G. Wilkening and L. Koenders, “Nanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro and Nanometer Range,” WILEY-VHC Verlag GmbH & Co. KGaA, pp. 87-89, 2005. DOI: 10.1002/cphc.200500543
20. [20] R. Krüger-Sehm, T. Dziomba, and G. Dai, “Investigations of Nanoroughness Standards by Scanning Force Microscopes and Interference Microscope,” G. Wilkening and L. Koenders (Eds.), Weinheim: Wiley-VCH, pp. 269-281, 2005. DOI: 10.1002/3527606661.ch20
21. [21] Kosaka Laboratory Ltd. Microfigure Measuring Instrument ET4000AK homepage: http://www.kosakalab.co.jp/english/product/precision/minute/#et4000 [accessed July 29, 2017].
22. [22] ISO 11562:1996, “Geometrical Product Specifications (GPS) – Surface texture: Profile method – Metrological characteristics of phase correct filters,” 1996 (JIS B 0632:2001).
23. [23] ISO 16610-21:2011, “Geometrical product specifications (GPS) – Filtration – Part 21: Linear profile filters: Gaussian filters,” 2011 (JIS B 0634:2017).
24. [24] J. K. Sinha, “Vibration Analysis, Instruments, and Signal Processing,” CRC Press, pp. 186-187, 2015. DOI: 10.1121/1.4932384
25. [25] L. Ding, M. Ali, S. Patole, and A. Dabak, “Vibration parameter estimation using FMCW radar,” the 41st Int. Conf. on Acoustics, Speech and Signal Processing Shanghai, pp. 2225-2228, 2016.
26. [26] ISO 3274:1996, “Geometrical Product Specifications (GPS) – Surface texture: Profile method – Nominal characteristics of contact (stylus) instruments,” 1996 (JIS B 0651:2001).