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IJAT Vol.7 No.6 pp. 638-643
doi: 10.20965/ijat.2013.p0638
(2013)

Paper:

Machining of Acrylic Resin Using Monocrystalline Diamond Endmill with Cutting Edges Formed by Focused Ion Beam

Tsunehisa Suzuki and Hiroshi Saito

Yamagata Research Institute of Technology, 2-2-1 Matsuei, Yamagata 990-2473, Japan

Received:
April 1, 2013
Accepted:
October 11, 2013
Published:
November 5, 2013
Keywords:
monocrystalline diamond endmill, focused ion beam, acrylic resin, cutting process
Abstract

The cutting edge of a single-blade monocrystalline diamond endmill was formed using the Focused Ion Beam technique (FIB): the cutting edge was mechanically polished to a rake angle of -70° and then formed to a rake angle of 0° by FIB sputtering. The performance of the diamond endmill was evaluated for the machining of acryl resin. Grooves were cut into optical acrylic resin with the resulting endmill; characteristics such as the surface roughness, cutting resistance, and chip shape were evaluated. The improved sharpness of the cutting edge reduced the surface roughness and cutting force in the depth direction. The surface roughness did not fluctuate even under the conditions of a fast feed rate and deep cutting depth. A cutter mark was observed on the finished surface, and flowing chips were generated unlike the performance of the -70° rake angle cutter.

Cite this article as:
T. Suzuki and H. Saito, “Machining of Acrylic Resin Using Monocrystalline Diamond Endmill with Cutting Edges Formed by Focused Ion Beam,” Int. J. Automation Technol., Vol.7, No.6, pp. 638-643, 2013.
Data files:
References
  1. [1] K. Abe “Lapping of diamonds,” J. of the Japan Society of Grinding Engineers, Vol.51, No.4, pp. 202-205, 2007.
  2. [2] I. Miyamoto and J. Taniguchi, “Fine machining of diamond utilizing ion and electron beams,” J. of the Japan Society of Grinding Engineers, Vol.46, No.1, pp. 25-28, 2002.
  3. [3] I. Miyamoto and N. Taniguchi, “Focused Ion Beam Fabrication of Micro-Mechanical Parts – Machining Characteristics of Polycrystalline Silicon and Computer Simulation of Profile Changes of Patterns,” CIRP Annals – Manufacturing Technology, Vol.39, No.1, pp. 205-208, 1990.
  4. [4] Y. N. Picard, D. P. Adams, M. J. Vasile, and M. B. Ritchey, “Focused ion beam-shaped microtools for ultra precision machining of cylindrical component,” Precision Engineering, Vol.27, pp. 59-69, 2003.
  5. [5] D. P. Adams, M. J. Vasile, G. Benavides, and A. N. Campbell, “Micromilling of metal alloys with focused ion beam – fabricatedtools,” J. of the Int. Societies for Precision Engineering and Nanotechnology, Vol.25, pp. 107-113, 2001.
  6. [6] T. Adachi and T. Kaito, “Focused ion beam machining of diamond, 1st report: Fundamental machining characteristics and attempt at processing a diamond turning tool,” The Japan Society for Abrasive Technology, Vol.53, No.6, pp. 362-367, 2009.
  7. [7] T. Adachi, T. Kaito, O. Takaoka, and T. Nakaue, “Focused ion beam machining of diamond, 2nd report: Beam diameter measurement method and fabrication of diamond tools for AFM-type machining systeml,” The Japan Society for Abrasive Technology, Vol.53, No.6, pp. 368-372, 2009.
  8. [8] H. Sasaoka, M. Ooka, and K. Nishimura, “Surface modification of single-crystalline diamond tool with high energy beam working,” The Japan Society for Abrasive Technology, Vol.56, No.1, pp. 40-43, 2012
  9. [9] N. Kawasegi, T. Niwata, N.Morita, K. Nishimura, and Hideki, “Improving machining performance of single-crystal diamond tools irradiated by a focused ion beam,” Precision Engineering. (in Press) [Available online 12 Sep. 2013]

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Last updated on Nov. 18, 2019