Development Report:
Measurement of Resistivity of Conductive Flat Plate Sample by the SRPM Method
Yoshihiro Nonaka*, Hiroshi Nakane*, Kiminori Hasuike*,
Takao Maeda* and Hirohiko Ishikawa**
*Science University of Tokyo, 1-3, Kagurazaka, Shinjuku-ku, Tokyo 162, Japan
**Antirsu Corporation, 5-10-27, Minami-Azabu, Minato-ku, Tokyo 106, Japan
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