Measurement of Resistivity of Conductive Flat Plate Sample by the SRPM Method
Yoshihiro Nonaka*, Hiroshi Nakane*, Kiminori Hasuike*,
Takao Maeda* and Hirohiko Ishikawa**
*Science University of Tokyo, 1-3, Kagurazaka, Shinjuku-ku, Tokyo 162, Japan
**Antirsu Corporation, 5-10-27, Minami-Azabu, Minato-ku, Tokyo 106, Japan
Takao Maeda, and Hirohiko Ishikawa, “Measurement of Resistivity of Conductive Flat Plate Sample by the SRPM Method,” J. Robot. Mechatron., Vol.5, No.3, pp. 266-273, 1993.
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