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IJAT Vol.17 No.4 pp. 410-421
doi: 10.20965/ijat.2023.p0410
(2023)

Research Paper:

Study on a Novel Peeling of Nano-Particle (PNP) Process for Localized Material Removal on a 4H-SiC Surface by Controllable Magnetic Field

Thitipat Permpatdechakul*,†, Panart Khajornrungruang** ORCID Icon, Keisuke Suzuki** ORCID Icon, and Shotaro Kutomi*

*Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology
680-4 Kawazu, Iizuka, Fukuoka 820-8502, Japan

Corresponding author

**Advanced Mechanical Division, Department of Intelligent and Control Systems, Kyushu Institute of Technology
Iizuka, Japan

Received:
January 17, 2023
Accepted:
April 19, 2023
Published:
July 5, 2023
Keywords:
nano-scale phenomenon, magnetic particle, in situ observation, localized remote control, hard material
Abstract

This study proposes a novel process called peeling of nano-particle (PNP) to remove material locally on a hard material surface, such as silicon carbide (SiC), diamond, and gallium nitride (GaN), using the magnetic nano-particles in an aqueous solution controlled by magnetic fields. By the concept of the PNP process, magnetic fields are generated by two solenoid coils, which are sandwiched between the hard material sample, to pull the magnetic nano-particles to adhere to and then peel the material from the sample surface. In this experiment, iron (II, III) oxide (Fe3O4) particles with a diameter size in the range of 50–100 nm were dispersed in water, and the pH value was adjusted to 10 by potassium hydroxide (KOH). The particles were magnetically controlled on the silicon carbide (4H-SiC) surface by the magnetic fields at approximately 17 mT. To confirm the contact phenomenon of the Fe3O4 particles on the 4H-SiC surface during the PNP process, an optical system was developed by applying evanescent field microscopy to limit the observation range to approximately 300 nm from the 4H-SiC surface. According to the experimental observed results, the control phenomenon of two examples of Fe3O4 particles could be observed through their scattering light, which relates to the magnetic field generating sequence wherein the particles were magnetically pulled in and out of the 4H-SiC surface in the limit range of the evanescent field. During the particle pull to the surface, particles were able to be tracked in the XY directions during the approach to the 4H-SiC surface. The Brownian motion ranges in all directions of the particles decreased when the particles approached close to the surface due to the pulling magnetic field. Moreover, the magnetic field enforced the magnetic moment of the particle and limited their rotation.

Cite this article as:
T. Permpatdechakul, P. Khajornrungruang, K. Suzuki, and S. Kutomi, “Study on a Novel Peeling of Nano-Particle (PNP) Process for Localized Material Removal on a 4H-SiC Surface by Controllable Magnetic Field,” Int. J. Automation Technol., Vol.17 No.4, pp. 410-421, 2023.
Data files:
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