Profile Measurement Using Confocal Chromatic Probe on Ultrahigh Precision Machine Tool
Hao Duan*, Shinya Morita*,, Takuya Hosobata**, Masahiro Takeda**, and Yutaka Yamagata**
*Tokyo Denki University
5 Senju Asahi-cho, Adachi-ku, Tokyo 120-8551, Japan
**RIKEN Center for Advanced Photonics, Wako, Japan
An on-machine measurement (OMM) system is an effective apparatus for achieving an efficient profile compensation and improving machining conditions in ultrahigh precision machining. Herein, we report a new OMM system with a confocal chromatic probe on a five-axis ultrahigh precision machine tool constructed using a real-time position capturing method. The probe and machine tool positions are captured synchronously using a personal computer to generate profile measurement data. Long- and short-term stability, micro step response, and repeatability tests using an optical flat indicates that the system has a precision of approximately ±10 nm. The profile measurement test using a reference sphere indicates that the precision of the OMM system deteriorated at a large slope angle of ±45°. However, the overall accuracy is estimated to be within ±100 nm at a slope angle within ±15°. The linearity test at various slope angles indicates that the decrease in reflected light from a mirror-like surface deteriorates the performance of the probe.
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