Development of Micro Probe System  for Micro Measurement Center

Ichiro Ogura; Yuichi Okazaki

doi:10.20965/ijat.2009.p0471

single-au.php

« previous

IJAT Vol.3 No.4 pp. 471-477

doi: 10.20965/ijat.2009.p0471

(2009)

Paper:

Views over last 60 days: 323

Development of Micro Probe System for Micro Measurement Center

Ichiro Ogura and Yuichi Okazaki

Advanced Manufacturing Research Institute (AMRI), National Institute of Advanced Industrial Science and Technology (AIST), 1-2-1 Namiki, Tsukuba, Ibaraki 305-8564, Japan

Received:

February 2, 2009

Accepted:

March 30, 2009

Published:

July 5, 2009

Keywords:

probe, CMM, precision measurement, micro parts, microfactory

Abstract

We developed two types of contact probe for micromeasurement. The first type -a dynamic motion probe with a probe ball 200 μm in diameter- is driven in a circle by piezoelectric (PZT) actuators at a radius of 3 μm and frequency of 10 Hz. The signal noise ratio indicates that the probe’s angle resolution is 1° and contact detection resolution of 50 nm. The second type of contact probe is static and developed for compact design. In addition to having a structure similar to earlier probes developed with a crossbeam plate, this one has a measurement ball glued to the front and back of the center plate. Optical sensors measure ball movement, which is synchronized with the contact probe. Basic experiments confirmed that the new probe has a measurement resolution of 50 nm.

Cite this article as:

I. Ogura and Y. Okazaki, “Development of Micro Probe System for Micro Measurement Center,” Int. J. Automation Technol., Vol.3 No.4, pp. 471-477, 2009.

Data files:

References

[1] Y. Arai, W. Gao, et al., “On-machine Measurement of Aspherical Surface Profile,” Nanotechnology and Precision Engineering, 2, 3, pp. 210-216, 2004.
[2] N. Ooyama, S. Kokaji, et al., “Desktop Machining Microfactory,” 2^nd International Workshop on Microfactories, pp. 13-16, 2000.
[3] Y. Okazaki and T. Kitahara, “NC micro-lathe to machine micro-parts,” Proc. ASPE 2000, Annual meeting, pp. 575-578, 2000.
[4] H. Maekawa and K. Komoriya, “Development of a micro transfer arm for a microfactory,” Proc. of IEEE Int. Conf. On Robotics and Automation, pp. 1444-1451, 2001.
[5] L. Ruisz-Huerta, “Basis for micro-factory : CNC micromachine tools,” Proc. ASPE 2001 Annual meeting, pp. 513-516, 2000.
[6] T. Kurita and M. Hattori, “Hybrid Micro Machine tool and its application”, 3^rd Int. Workshop on Microfactories, pp. 149-152, 2002.

This article is published under a Creative Commons Attribution-NoDerivatives 4.0 Internationa License.

[1] [1] Y. Arai, W. Gao, et al., “On-machine Measurement of Aspherical Surface Profile,” Nanotechnology and Precision Engineering, 2, 3, pp. 210-216, 2004.

[2] [2] N. Ooyama, S. Kokaji, et al., “Desktop Machining Microfactory,” 2^nd International Workshop on Microfactories, pp. 13-16, 2000.

[3] [3] Y. Okazaki and T. Kitahara, “NC micro-lathe to machine micro-parts,” Proc. ASPE 2000, Annual meeting, pp. 575-578, 2000.

[4] [4] H. Maekawa and K. Komoriya, “Development of a micro transfer arm for a microfactory,” Proc. of IEEE Int. Conf. On Robotics and Automation, pp. 1444-1451, 2001.

[5] [5] L. Ruisz-Huerta, “Basis for micro-factory : CNC micromachine tools,” Proc. ASPE 2001 Annual meeting, pp. 513-516, 2000.

[6] [6] T. Kurita and M. Hattori, “Hybrid Micro Machine tool and its application”, 3^rd Int. Workshop on Microfactories, pp. 149-152, 2002.